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Christophe Gorecki

  • Interferometry XIIIInterferometry XIII
  • Microsystems engineeringMicrosystems engineering
  • Microsystems engineeringMicrosystems engineering
  • Microsystems metrology and inspectionMicrosystems metrology and inspection
  • Optical inspection and micromeasurements IIOptical inspection and micromeasurements II
  • Optical measurements and sensors for the process industriesOptical measurements and sensors for the process industries
  • Optical micro- and nanometrology in manufacturing technologyOptical micro- and nanometrology in manufacturing technology
  • Interferometry XIVInterferometry XIV
  • Interferometry XVIIInterferometry XVII
  • Optical inspection and micromeasurementsOptical inspection and micromeasurements
  • Optical measurement systems for industrial inspection VOptical measurement systems for industrial inspection V
  • Optical Micro and Nanometrology in Microsystems TechnologyOptical Micro and Nanometrology in Microsystems Technology