David G. Seiler

• Characterization and metrology for ULSI technology, 2000
• Life on Hold
• Semiconductor characterization
• Characterization and metrology for ULSI technology
• Improved characterization and evaluation measurements for HgCdTe detector materials, processes, and devices used on the GOES and TIROS satellites
• Metrology and Diagnostic Techniques for Nanoelectronics
• Narrow-gap semiconductors and related materials
• Semiconductors and semimetals
• Spectroscopy of Semiconductors