Defects in SiO2 and Related Dielectrics: Science and Technology

Defects in SiO2 and Related Dielectrics: Science and Technology

Science and Technology ; [proceedings of the NATO Advanced Study Institute on Defects in SiO 2 and Related Dielectrics: Science and Technolgy, Erice, Italy, April 8 - 20, 2000]

by Gianfranco Pacchioni, Linards Skuja, David Griscom

624 pages· 2000· ISBN 9780792366850
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Proceedings of the NATO Advanced Study Institute, Erice, Italy, April 8-20, 2000

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