VLSI Test Principles and Architectures

VLSI Test Principles and Architectures

Design for Testability

by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen

808 pages· 2006· ISBN 9780080474793
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This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. · Most up-to-date coverage of design for testability. · Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. · Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures. · Lecture slides and exercise solutions for all chapters are now available. · Instructors are also eligible for downloading PPT slide files and MSWORD solutions files from the manual website.

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